Terahertz Time Domain Spectroscopy with Parallel Plate Waveguides

Abstract

<p>The Terahertz (THz) spectral range has received considerable attention for the development of non-destructive evaluation applications. This is due to the relatively high transmission through most dielectrics and high reflectivity off of metallic surfaces. THz spectroscopy can provide a non-destructive, standoff analysis technique capable of detecting corrosion on metallic surfaces under obscurants and defects in composite materials on aerospace structures. Such techniques has been utilized in the X-ray region of the spectrum, but unlike X-rays, THz is non ionizing and non destructive, enabling it to be safer for the user, and cause no harm to the sample. For the case of thin film samples however, there is not enough interaction between the signal and the sample to do an accurate analysis of the sample. The use of a parallel plate wave guide, with a thin film sample on one of the plate will increase interaction time between the signal and that sample, allowing for an in-depth analysis of different types of thin film samples.</p><p>This presentation occurred at the Wright State University Campus-Wide Celebration of Research, Scholarship and Creative Activities on April 16, 2010</p>